• DocumentCode
    1375640
  • Title

    Measurement of complex permittivity and permeability of dielectric materials placed on a substrate

  • Author

    Kamarei, M. ; Daoud, N. ; Salazar, R. ; Bouthinon, M.

  • Author_Institution
    LEMO-INPG, CNRS VAR, Grenoble, France
  • Volume
    27
  • Issue
    1
  • fYear
    1991
  • Firstpage
    68
  • Lastpage
    70
  • Abstract
    A broad-band technique for making simultaneous frequency-swept measurements of complex permittivity and permeability of dielectric materials placed on a known substrate is described. The characteristics of these dielectric materials are evaluated from two-port scattering parameter measurements of a stripline cell, by using a microwave vector network analyser. Study of the sensitivity of the calculated permittivity and permeability as a function of the measurement errors is included.
  • Keywords
    magnetic permeability measurement; materials testing; measurement errors; microwave measurement; permittivity measurement; strip line components; broad-band technique; complex permeability measurement; complex permittivity; dielectric materials; frequency-swept measurements; known substrate; measurement; measurement errors; microwave permeability; microwave permittivity; microwave vector network analyser; sensitivity; stripline cell; two-port scattering parameter measurements;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910044
  • Filename
    60809