Image reconstruction from TE scattering data using equation of strong permittivity fluctuation

Author

Ma, Jianglei ; Cho Chew, Weng ; Lu, Cai-Cheng ; Song, Jiming

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA

Volume

48

Issue

6

fYear

2000

fDate

6/1/2000 12:00:00 AM

Firstpage

860

Lastpage

867

Abstract

Compared to the TM case, the inverse scattering problem for the TE incident field is more complicated due to its stronger nonlinearity. This work provides an effective method for the reconstruction of two-dimensional (2-D) inhomogeneous dielectric objects from TE scattering data. The algorithm applies the distorted Born iterative method to the integral equation of strong permittivity fluctuation to reconstruct scatterers with high-permittivity contrast. Numerical simulations are performed and the results show that the distorted Born iterative method (DBIM) for strong permittivity fluctuation (SPF-DBIM) converges faster and can obtain better reconstructions for objects with larger dimensions and higher contrasts in comparison with ordinary DBIM. A frequency hopping technique is also applied to further increase the contrast

Keywords

electromagnetic wave polarisation; electromagnetic wave scattering; image reconstruction; integral equations; inverse problems; iterative methods; numerical analysis; permittivity; 2D inhomogeneous dielectric objects reconstruction; TE incident field; TE polarization; TE scattering data; direct scattering solution; distorted Born iterative method; frequency hopping; high-permittivity contrast; image reconstruction; integral equation; inverse scattering problem; inverse scattering solution; microwave imaging; nonlinearity; numerical simulations; strong permittivity fluctuation equation; Dielectrics; Fluctuations; Image reconstruction; Inverse problems; Iterative methods; Nonlinear equations; Permittivity; Scattering; Tellurium; Two dimensional displays;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.865217

Filename

865217