• DocumentCode
    1376602
  • Title

    Line network network (LNN): an alternative in-fixture calibration procedure

  • Author

    Heuermann, Holger ; Schiek, Burkhard

  • Author_Institution
    Dev. Dept., Rosenberger HF-Technik GmbH & Co., Tittmoning, Germany
  • Volume
    45
  • Issue
    3
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    408
  • Lastpage
    413
  • Abstract
    An alternative method for a network analyzer calibration is evaluated. This line network network (LNN) method avoids de-embedding of the device under test (DUT) and it allows the characterization of an unknown two-port inserted between an arbitrary number of cascaded unknown two-ports. An unknown obstacle must be moved on a transmission line into three positions. The LNN calibration technique delivers the electrical wavelength or the relative dielectric constant of the transmission line and the scattering parameters of the obstacle. Since the connectors do not have to be exchanged, nonreproducibilities of the connectors are only a minor problem. Additionally, a double-calibration technique is presented. The double-calibration technique is used to employ the LNN method on both sides of the two-port DUT in order to perform an error-corrected measurement. Experimental results compare the LNN method with the tru-reflect-line (TRL) method particularly for an in-fixture calibration
  • Keywords
    S-parameters; calibration; error correction; measurement errors; microwave measurement; network analysers; LNN; double-calibration technique; electrical wavelength; error-corrected measurement; in-fixture calibration procedure; line network network; network analyzer calibration; nonreproducibilities; relative dielectric constant; scattering parameters; unknown two-port; Antenna measurements; Calibration; Connectors; Fixtures; Frequency; Performance evaluation; Scattering parameters; Semiconductor device measurement; Testing; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.563340
  • Filename
    563340