Title :
Current Limiting Phenomena in
Coated Conductors Observed by Laser-Induced Thermoelectric Imaging and Low-Temperature Laser Sca
Author :
Kim, G. ; Jo, W. ; Matsekh, A. ; Inoue, M. ; Kiss, T. ; Ha, H.S. ; Oh, S.S.
Author_Institution :
Dept. of Phys., Ewha Womans Univ., Seoul, South Korea
fDate :
6/1/2011 12:00:00 AM
Abstract :
SmBa2Cu3O7 (SmBCO) coated conductors were grown on IBAD-MgO templates the evaporation using a drum-in-dual-chambers (EDDC) deposition system. The material showed a critical temperature of 93 ~ 94 K and a critical current of 200 ~ 250 A/cm-width at 77 K in a self-field. The current-limiting properties and local structure of the films were examined by laser-induced thermoelectric (LITE) imaging and low temperature laser scanning microscopy (LTLSM). Surface morphology and chemical composition of the superconducting layers were examined by scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS), respectively. A 100μm × 1 mm-microbridge was fabricated using a photolithographic technique and etching process. The measured LITE images of the SmBCO coated conductor showed that some grains on the surface, surface inhomogeneity, second phases, defects and tilted grains, cause different thermal gradients. The LTLSM images revealed two dimensional variations of local flux flow on the films as a function of the local critical current. The findings are consistent with the LITE images, indicating that both methods can visualize the local structures and phases.
Keywords :
barium compounds; conductors (electric); critical currents; current limiters; high-temperature superconductors; optical microscopy; samarium compounds; scanning electron microscopy; superconducting thin films; superconducting transition temperature; surface morphology; EDDC deposition system; EDS; IBAD-MgO templates; SEM; SmBCO coated conductors; SmBa2Cu3O7; chemical composition; critical temperature; current limiting phenomena; energy dispersive spectroscopy; evaporation using drum-in-dual-chambers; laser-induced thermoelectric imaging; local critical current; local flux flow; low-temperature laser scanning microscopy; scanning electron microscopy; second phase; superconducting layers; surface defects; surface grains; surface inhomogeneity; surface morphology; temperature 77 K; thermal gradients; tilted grains; Conductors; Critical current; Current measurement; Imaging; Measurement by laser beam; Surface morphology; Temperature measurement; Current limiting properties; HTS; LITE images; LTLSM; SmBCO thin films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2086040