Title :
A bridge for measuring the a.c. parameters of point-contact transistors
Author :
Boothroyd, A.R. ; Datta, S.K.
fDate :
10/1/1954 12:00:00 AM
Keywords :
insulation testing; transistors;
Journal_Title :
Proceedings of the IEE - Part II: Power Engineering
DOI :
10.1049/pi-2.1954.0120