DocumentCode :
1378843
Title :
The measurement of the small-signal characteristics of transistors
Author :
Cooke-Yarborough, E.H. ; Florida, C.D. ; Steohen, J.H.
Volume :
101
Issue :
83
fYear :
1954
fDate :
10/1/1954 12:00:00 AM
Firstpage :
569
Keywords :
characteristics measurement; transistors;
fLanguage :
English
Journal_Title :
Proceedings of the IEE - Part II: Power Engineering
Publisher :
iet
Type :
jour
DOI :
10.1049/pi-2.1954.0119
Filename :
5240626
Link To Document :
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