Title :
Study of Synergism Effect Between TID and ATREE on the Response of the LM124 Operational Amplifier
Author :
Roche, Nicolas J -H ; Perez, Stephanie ; Mekki, Julien ; Velo, Y. Gonzalez ; Dusseau, Laurent ; Boch, Jérôme ; Vaillé, Jean-Roch ; Saigné, Frédéric ; Marec, Ronan ; Calvel, Philippe ; Bezerra, Francoise ; Auriel, Gérard ; Azaïs, Bruno ; Buchner, Stephen P
Author_Institution :
IES, Univ. Montpellier 2, Montpellier, France
Abstract :
The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs´ is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.
Keywords :
X-ray effects; bipolar analogue integrated circuits; integrated circuit modelling; operational amplifiers; LM124 operational amplifier; analog transient radiation effects; bias configurations; flash X-ray facility; high dose-rate X-ray pulses; predictive methodology; simulation tool; synergism effect; synergistic phenomena; total ionizing dose; Bipolar integrated circuits; Degradation; Integrated circuit modeling; Radiation effects; Resistance; Single event transient; Transient response; Bipolar analog integrated circuits; integrated circuit modeling; ionizing dose; single event transient; transient propagation; transient radiation effects; transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2172630
