• DocumentCode
    1379528
  • Title

    Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

  • Author

    Kauppila, A.V. ; Bhuva, B.L. ; Massengill, L.W. ; Holman, W.T. ; Ball, D.R.

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    58
  • Issue
    6
  • fYear
    2011
  • Firstpage
    2658
  • Lastpage
    2663
  • Abstract
    Process variations and charge sharing impact the single-event circuit response. This paper correlates parameter shift impact on the single-event upset (SEU) probability of flip-flop designs in advanced CMOS processes under the influence of charge sharing.
  • Keywords
    CMOS logic circuits; flip-flops; probability; SEU probability; advanced CMOS processes; charge sharing impact; flip-flop designs; flip-flops; parameter shift impact; process variations; single-event upset probability; single-event-upset response; CMOS technology; Flip-flops; Monte Carlo methods; Semiconductor device modeling; Sensitivity; Single event transient; Single event upset; CMOS; Charge sharing; critical charge; single-event effects; single-event transients; single-event upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2172691
  • Filename
    6084770
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1379528