Title :
Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor
Author :
Cabanas-Holmen, Manuel ; Cannon, Ethan H. ; Amort, Tony ; Ballast, Jon ; Brees, Roger ; Fischer, Steve ; KleinOsowski, A.J. ; Meaker, Barry ; Swann, Terry ; Wert, Jerry
Author_Institution :
Boeing Co. Seattle, Seattle, WA, USA
Abstract :
We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy.
Keywords :
microprocessor chips; radiation hardening (electronics); redundancy; design microprocessor; radiation hardening; redundancy; single-event error rate; system-level recovery; Error analysis; Microprocessors; Radiation effects; Radiation hardening; Single event transient; Single event upset; Heavy ion radiation effects; radiation effects; single event transient; single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2168978
