Title :
Theory and design of adjacent asymmetric error masking codes
Author :
Tallini, Luca G. ; Bose, Bella
Author_Institution :
Dipartimento di Inf. ed Applicazioni, Salerno Univ., Italy
fDate :
5/1/1998 12:00:00 AM
Abstract :
Recently, Matsuzawa and Fujiwara (1988) proposed a novel scheme to mask line faults of bus line circuits (such as address buses) due to short circuit defects between adjacent lines. In this paper, first we propose the fundamental theory and then present some efficient designs of these codes. Some lower and upper bounds for the optimal codes are also given
Keywords :
error correction codes; error detection codes; logic design; asymmetric error masking codes; bus line circuits; optimal codes; upper bounds; Circuit faults; Decoding; Driver circuits; Error correction; Mercury (metals); Random access memory; Read only memory; Read-write memory; Upper bound; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
