• DocumentCode
    138118
  • Title

    Thermo-mechanical simulation of plastic deformation during temperature cycling of bond wires for power electronic modules

  • Author

    Wright, Andrew ; Hutzler, Aaron ; Schletz, A. ; Pichler, Peter

  • Author_Institution
    Fraunhofer Inst. for Integrated Syst. & Device Technol. (IISB), Erlangen, Germany
  • fYear
    2014
  • fDate
    7-9 April 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Modelling was undertaken to investigate the role of bond wire size on reliability in power electronic converters. Experiments have shown that thin 125 μm Al wires used in place of 375 μm Al wires alleviate bond wire lift-off and further outlast other sources of failure such as solder degradation in a power module. To investigate the role of bond-wire size on wire lift-off, the effective plastic strain was estimated through thermo-mechanical simulation. Three-dimensional models were constructed for the thin and thick bond wires, respectively. For the critical deformation of the aluminium bond wires during thermal cycling, a temperature-dependent bi-linear plasticity model was used. The effect of a difference in yield strength for the thin wires was also investigated. Maximum as well as volumetrically averaged values of the effective plastic strain showed significant differences between the thick and thin wires and wires with different yield strengths. The modelling results show higher effective plastic strain for the thick wires - supporting the experimental findings.
  • Keywords
    aluminium alloys; circuit reliability; plastic deformation; power convertors; wires (electric); yield strength; Al; aluminium bond wires; bond wire lift-off; bond wire size; plastic deformation; plastic strain; power electronic converters; power electronic modules; reliability; size 125 mum; size 375 mum; solder degradation; temperature cycling; temperature-dependent bi-linear plasticity model; thermo-mechanical simulation; three-dimensional models; yield strength; Abstracts; Artificial intelligence; Copper; Europe; Reliability; Silicon; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
  • Conference_Location
    Ghent
  • Print_ISBN
    978-1-4799-4791-1
  • Type

    conf

  • DOI
    10.1109/EuroSimE.2014.6813813
  • Filename
    6813813