DocumentCode :
1381368
Title :
Nonvolatile SRAM cell using different capacitance loading
Author :
Hur, Sung-Hoi ; Han, Chul-Hi
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Volume :
34
Issue :
3
fYear :
1998
fDate :
2/5/1998 12:00:00 AM
Firstpage :
251
Lastpage :
253
Abstract :
A simple and novel nonvolatile SRAM (NVSRAM) cell is proposed. NVSRAM cell can be achieved by adding only one nonvolatile device with split floating gates to a conventional SRAM cell. It acts as a conventional SRAM cell under normal operation. SRAM cell data are programmed to the nonvolatile device by hot electron injection. At power up, data are restored using different capacitance loading resulting from the split floating gate. The operations have been confirmed by circuit simulation. The NVSRAM cell is symmetric, and therefore has better retention characteristics than other NVSRAM cells
Keywords :
SRAM chips; capacitance; hot carriers; capacitance loading; circuit simulation; hot electron injection; nonvolatile SRAM cell; split floating gate device;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19980234
Filename :
677342
Link To Document :
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