DocumentCode :
1382068
Title :
Microwave oscillators incorporating high performance distributed Bragg reflector microwave resonators
Author :
Flory, Curt A. ; Ko, Herbert L.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Volume :
45
Issue :
3
fYear :
1998
fDate :
5/1/1998 12:00:00 AM
Firstpage :
824
Lastpage :
829
Abstract :
We previously demonstrated a new resonator device structure that achieves Q-factors well above those currently realisable. The new structure consists of a microwave cavity, where the enclosure walls consist of distributed Bragg reflectors (DBRs) in three dimensions, made of low-loss sapphire. Theoretical analysis has demonstrated that the resonator´s performance is critically dependent upon accurate alignment of the DBR components, thereby maintaining the desired symmetry of the resonant structure. Breaking of the symmetry causes mixing of the high performance Bragg reflected mode with low-Q hybrid cavity modes. The fabrication tolerances required to achieve the expected resonator performance are met with a precise but simple alignment tool. A pair of these resonators have been built at 9.0 GHz, and have demonstrated unloaded Qs in excess of 700,000 at room temperature. These resonators are incorporated into simple two-port feedback oscillator circuits. Phase noise measurements were performed on the two free-running oscillators.
Keywords :
Q-factor; cavity resonators; dielectric resonator oscillators; feedback oscillators; microwave oscillators; phase noise; two-port networks; 9.0 GHz; Al/sub 2/O/sub 3/; Q-factor; alignment tool; distributed Bragg reflector microwave resonator; fabrication tolerance; microwave cavity; microwave oscillator; phase noise; sapphire; two-port feedback oscillator circuit; Distributed Bragg reflectors; Fabrication; Feedback circuits; Microwave devices; Microwave oscillators; Performance analysis; Phase noise; Q factor; Resonance; Temperature;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.677746
Filename :
677746
Link To Document :
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