High-frequency periodic time-domain waveform measurement system

Author

Sipilä, Markku ; Lehtinen, Kari ; Porra, Veikko

Author_Institution

Fac. of Electr. Eng., Helsinki Univ., of Technol., Espoo, Finland

Volume

36

Issue

10

fYear

1988

fDate

10/1/1988 12:00:00 AM

Firstpage

1397

Lastpage

1405

Abstract

A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device. The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed

Keywords

electric current measurement; error correction; measurement errors; microwave measurement; semiconductor device testing; solid-state microwave devices; voltage measurement; wave analysers; HF type; circuit model; current waveforms; error correction; high-speed sampling oscilloscope; measurement fixture; measurement-system characterization; nonlinear microwave device; periodic time-domain waveform measurement system; semiconductor devices; signal processing errors; Current measurement; Frequency domain analysis; Microwave devices; Microwave measurements; Oscilloscopes; Performance evaluation; Sampling methods; Time domain analysis; Time measurement; Voltage;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.6087

Filename

6087