• DocumentCode
    1384158
  • Title

    A Power-Efficient 32 bit ARM Processor Using Timing-Error Detection and Correction for Transient-Error Tolerance and Adaptation to PVT Variation

  • Author

    Bull, David ; Das, Shidhartha ; Shivashankar, Karthik ; Dasika, Ganesh S. ; Flautner, Krisztian ; Blaauw, David

  • Author_Institution
    ARM Inc., Cambridge, UK
  • Volume
    46
  • Issue
    1
  • fYear
    2011
  • Firstpage
    18
  • Lastpage
    31
  • Abstract
    Razor is a hybrid technique for dynamic detection and correction of timing errors. A combination of error detecting circuits and micro-architectural recovery mechanisms creates a system that is robust in the face of timing errors, and can be tuned to an efficient operating point by dynamically eliminating unused timing margins. Savings from margin reclamation can be realized as per device power-efficiency improvement, or parametric yield improvement for a batch of devices. In this paper, we apply Razor to a 32 bit ARM processor with a micro-architecture design that has balanced pipeline stages with critical memory access and clock-gating enable paths. The design is fabricated on a UMC 65 nm process, using industry standard EDA tools, with a worst-case STA signoff of 724 MHz. Based on measurements on 87 samples from split-lots, we obtain 52% power reduction for the overall distribution at 1 GHz operation. We present error rate driven dynamic voltage and frequency scaling schemes where runtime adaptation to PVT variations and tolerance of fast transients is demonstrated. All Razor cells are augmented with a sticky error history bit, allowing precise diagnosis of timing errors over the execution of test vectors. We show potential for parametric yield improvement through energy-efficient operation using Razor.
  • Keywords
    error correction; error detection; microprocessor chips; EDA tools; PVT variation; Razor technique; dynamic voltage; error detecting circuits; frequency 724 MHz; frequency scaling; micro-architectural recovery mechanisms; power-efficient ARM processor; size 65 nm; timing-error correction; timing-error detection; transient-error tolerance; word length 32 bit; Clocks; Delay; Monitoring; Pipelines; Random access memory; Temperature measurement; Adaptive design; dynamic voltage and frequency scaling; energy-efficient circuits; parametric yield; variation tolerance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2079410
  • Filename
    5640683