Title :
Pulse response of junction transistors
Author :
Enenstein, Norman H. ; McMahon, Morgan E.
Author_Institution :
Research and Development Laboratories, Hughes Aircraft Company, Culver City, California
fDate :
6/1/1953 12:00:00 AM
Abstract :
This paper discusses the transient response of junction transistors. The experimental results are compared with the theoretical relationships. The case for low load resistance, in which collector cutoff due to its capacitance does not occur, is considered. The treatment is confined to small-signal operation.
Keywords :
Approximation methods; Capacitance; Charge carrier processes; Junctions; Pulse measurements; Steady-state; Transistors;
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
DOI :
10.1109/IREPGED.1953.6811069
