Title :
Sputtered NiFeZr as a soft biasing layer in MR head
Author :
Choukh, Alexandre M.
Author_Institution :
Samsung Adv. Inst. of Technol., Suwon, South Korea
fDate :
9/1/1996 12:00:00 AM
Abstract :
The sputtered soft magnetic NiFeZr films were studied experimentally for the use as a soft adjacent layer (SAL) in magnetoresistive (MR) heads. The influence of the film thickness and sputtering conditions on the magnetic and electrical properties of the films was investigated. The coercivity HC and the anisotropy field HK considerably depends on the substrate temperature T S during the deposition. The films of the thickness below 400 Å have the following properties: HC<0.5 Oe, HK <6 Oe, a resistivity ρ=91 μOhm·cm, a magnetoresistance ratio Δρ/ρ<0.05%, a saturation induction Bs=0.65 T, and a magnetostriction constant λ s=4×10-7. The films exhibit stable amorphous structure. The above results show that sputtered NiFeZr films emerge as a good candidate for SAL in MR heads. Some characteristics of three-layered (NiFeZr/Ta/NiFe) MR elements have also been discussed in this paper
Keywords :
amorphous magnetic materials; coercive force; electrical resistivity; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic heads; magnetoresistance; magnetoresistive devices; magnetostriction; nickel alloys; soft magnetic materials; zirconium alloys; 0.65 T; 400 A; NiFeZr; NiFeZr-Ta-NiFe; NiFeZr/Ta/NiFe; anisotropy field; coercivity; film thickness; magnetoresistance ratio; magnetoresistive heads; magnetostriction constant; resistivity; saturation induction; soft adjacent layer; sputtered soft magnetic films; sputtering conditions; stable amorphous structure; substrate temperature; Amorphous magnetic materials; Magnetic anisotropy; Magnetic films; Magnetic heads; Magnetic properties; Magnetoresistance; Magnetostriction; Perpendicular magnetic anisotropy; Saturation magnetization; Soft magnetic materials;
Journal_Title :
Magnetics, IEEE Transactions on
