Title :
Test pattern generation for API faults in RAM
Author :
De Jong, Petra ; Van de Goor, Ad J.
Author_Institution :
Volmac Networks bv, Woerden, Netherlands
fDate :
11/1/1988 12:00:00 AM
Abstract :
The algorithm for detecting pattern-sensitive faults in memories, as presented by K.K. Salnja, K. Kinoshita (ibid., vol.34, no.3, p.284-7, 1985), is simplified. In addition, a new algorithm is presented which has a near optimal WRITE sequence
Keywords :
automatic testing; fault location; integrated circuit testing; integrated memory circuits; random-access storage; API faults; BIST; Hamiltonian paths; RAM; near optimal WRITE sequence; pattern-sensitive faults; test pattern generation; Fault detection; Hydrogen; Interference; Random access memory; Read-write memory; Test pattern generators; Testing;
Journal_Title :
Computers, IEEE Transactions on
