DocumentCode :
1388518
Title :
A good puncturing scheme for rate compatible low-density parity-check codes
Author :
Choi, Sunghoon ; Yoon, Sungroh ; Sung, Wonjin ; Kwon, Hongkyu ; Heo, Jun
Author_Institution :
LG electronics Inc., Seoul, Korea
Volume :
11
Issue :
5
fYear :
2009
Firstpage :
455
Lastpage :
463
Abstract :
We consider the challenges of finding good puncturing patterns for rate-compatible low-density parity-check code (LDPC) codes over additive white Gaussian noise (AWGN) channels. Puncturing is a scheme to obtain a series of higher rate codes from a lower rate mother code. It is widely used in channel coding but it causes performance is lost compared to non-punctured LDPC codes at the same rate. Previous work, considered the role of survived check nodes in puncturing patterns. Limitations, such as single survived check node assumption and simulation-based verification, were examined. This paper analyzes the performance according to the role of multiple survived check nodes and multiple dead check nodes. Based on these analyses, we propose new algorithm to find a good puncturing pattern for LDPC codes over AWGN channels.
Keywords :
AWGN; Algorithm design and analysis; Electronic mail; Error probability; Gaussian approximation; Parity check codes; Random variables; block-type LDPC codes (B-LDPC); density evolution (DE); low-density parity-check code (LDPC) codes; puncturing;
fLanguage :
English
Journal_Title :
Communications and Networks, Journal of
Publisher :
ieee
ISSN :
1229-2370
Type :
jour
DOI :
10.1109/JCN.2009.6388389
Filename :
6388389
Link To Document :
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