Quantitative magnetometry using electron holography: field profiles near magnetic force microscope tips

Author

Streblechenko, Dmitry G. ; Scheinfein, M.R. ; Mankos, Marian ; Babcock, Ken

Author_Institution

Dept. of Phys., Arizona State Univ., Tempe, AZ, USA

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

4124

Lastpage

4129

Abstract

Magnetic force microscopy offers an inexpensive means of measuring magnetic microstructure with high spatial resolution by scanning a magnetized tip across the surface of a magnetic sample. Contrast in the magnetic force microscope is a complicated function of the magnetic fields emanating both from the tip and the sample under observation. Electron holographic methods were used in order to quantitatively determine the fields in proximity to extremely small magnetic force microscope tips

Keywords

electron optics; holography; image reconstruction; image resolution; magnetic field measurement; magnetic force microscopy; magnetometers; scanning-transmission electron microscopy; contrast; electron holography; extremely small magnetic force microscope tips; far-out-of-focus STEM electron holography; field profile measurement; high spatial resolution; magnetic force microscopy; magnetic microstructure; magnetic sample surface scanning; magnetized tip; quantitative magnetometry; reconstructed phase; Electron beams; Electron microscopy; Holography; Magnetic analysis; Magnetic force microscopy; Magnetic forces; Magnetic separation; Magnetostatic waves; Micromagnetics; Scanning electron microscopy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539316

Filename

539316