Title :
Structured CsI(Tl) scintillators for X-ray imaging applications
Author :
Nagarkar, V.V. ; Gupta, T.K. ; Miller, S.R. ; Klugerman, Y. ; Squillante, M.R. ; Entine, G.
Author_Institution :
Radiat. Monitoring Devices Inc., Watertown, MA, USA
fDate :
6/1/1998 12:00:00 AM
Abstract :
We are developing large-area, thick, structured CsI(Tl) imaging sensors fora wide variety of X-ray imaging applications. Recently we have fabricated structured CsI(Tl) scintillators ranging from 30 μm (16 mg/cm2) to 2000 μm (900 mg/cm2) in thickness and up to 15×15 cm2 in area. Even 2000-μm-thick film showed well-controlled columnar growth throughout the film. Material characterization confirmed that the film is crystalline in nature and that the stoichiometry is preserved. To improve the spatial resolution of thick films, post-deposition treatments were performed. The effect of these treatments on film characteristics was quantitatively evaluated by measuring signal output, modulation transfer function, noise power spectrum, and detective quantum efficiency. The data show that by proper film treatments, the film detective quantum efficiency can be improved
Keywords :
X-ray detection; X-ray imaging; caesium compounds; solid scintillation detectors; thallium; vapour deposited coatings; CsI:Tl; X-ray imaging applications; columnar growth; detective quantum efficiency; modulation transfer function; noise power spectrum; post-deposition treatments; signal output; stoichiometry; structured CsI(Tl) scintillators; Crystalline materials; Crystallization; Image sensors; Noise measurement; Optical imaging; Power measurement; Spatial resolution; Thick films; Transfer functions; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
