DocumentCode :
1390058
Title :
High-Performance Oxide Thin-Film Transistors Using a Volatile Nitrate Precursor for Low-Temperature Solution Process
Author :
Jeong, Woong Hee ; Bae, Jung Hyeon ; Kim, Hyun Jae
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Volume :
33
Issue :
1
fYear :
2012
Firstpage :
68
Lastpage :
70
Abstract :
Solution-processed InZnO (IZO) thin-film transistors (TFTs) are fabricated using a volatile metal nitrate precursor (Np) with annealing at 300°C. Because the metal Np decomposes at low temperatures, metal oxide bonds were formed, and the organic residue in the oxide thin films was evaporated at low temperature. At 300°C , the IZO thin films with Zn Np were of higher quality than those with Zn acetate precursor due to the reduced atomic disorder and evaporation of residual organics. The mobility of the IZO TFTs with Zn Np was 1.92 cm2/V·s at 300°C annealing.
Keywords :
II-VI semiconductors; annealing; indium compounds; thin film transistors; vacuum deposition; zinc compounds; InZnO; acetate precursor; annealing; atomic disorder; evaporation; low-temperature solution process; metal oxide bonds; organic residue; oxide thin-film transistors; temperature 300 degC; volatile metal nitrate precursor; volatile nitrate precursor; Annealing; Temperature; Thin film transistors; X-ray scattering; Zinc; Indium zinc oxide; low temperature; nitrate precursor (Np); solution process; thin-film transistor (TFT);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2173897
Filename :
6095583
Link To Document :
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