• DocumentCode
    1390785
  • Title

    Nondestructive inspection using Compton scatter tomography

  • Author

    Evans, B.L. ; Martin, J.B. ; Burggraf, L.W. ; Roggemann, M.C.

  • Author_Institution
    Dept. of Eng. Phys., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    950
  • Lastpage
    956
  • Abstract
    A method for non-invasively generating tomographic images of electron density in materials using Compton scattered gamma rays is investigated. Electron density is an indicator of density or composition changes in a material. In Compton scatter tomography, the energy distribution of monoenergetic gamma rays is measured after scattering from a material target. Measuring a scattered gamma ray´s energy localizes the scattering position to a definable region of the sample. We develop an analytic computational model to study the image quality of a realistic system. In particular, the deleterious effects of finite source and detector size, Compton broadening, and Poisson noise are investigated. A backprojection algorithm is presented to demonstrate the impact of these effects on image reconstruction and contrast recovery. Detection of corrosion in low-Z materials is an application of interest, and is used to study the Compton scatter tomography technique
  • Keywords
    Compton effect; biomedical imaging; computerised tomography; corrosion testing; gamma-ray detection; image reconstruction; inspection; nondestructive testing; Compton broadening; Compton scatter tomography; Compton scattered gamma rays; Poisson noise; analytic computational model; backprojection algorithm; composition changes; contrast recovery; corrosion detection; deleterious effects; electron density; energy distribution; image reconstruction; low-Z materials; monoenergetic gamma rays; nondestructive inspection; tomographic images; Composite materials; Electrons; Energy measurement; Gamma rays; Image analysis; Image generation; Inspection; Position measurement; Scattering; Tomography;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.682682
  • Filename
    682682