DocumentCode
1390804
Title
High Operating Temperature Quantum-Dot Infrared Photodetector Using Advanced Capping Techniques
Author
Shao, Jiayi ; Vandervelde, Thomas E. ; Jang, Woo-Yong ; Stintz, Andreas ; Krishna, Sanjay
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
Volume
10
Issue
5
fYear
2011
Firstpage
1010
Lastpage
1014
Abstract
We demonstrate an improvement in the operating temperature of a quantum dot-in-a-well (DWELL)-based infrared photodetector with spectral response observable till 250 K. This improvement was achieved through engineering the dot geometry and the quantum confinement via postgrowth capping of the quantum dots (QDs) by selecting overlying materials under various growth conditions. The effect of the capping procedures was determined by examining the optical properties of the QDs. These were then introduced into the active region of a DWELL IR photodetector. Using this approach, the dark current density is as low as 6.3 × 10-7 A/cm2 (Vb = 7 V) at 77 K; the highest operating temperature is increased to 250 K with the λp = 3.2 μm. The peak detectivity is found to be 1 × 109 cm·Hz1/2 /W at 77 K and 7.2 × 107 cm·Hz1/2/W at 250 K.
Keywords
current density; infrared detectors; nanosensors; photodetectors; quantum dots; DWELL IR photodetector; DWELL-based infrared photodetector; capping techniques; dark current density; dot geometry; high operating temperature quantum-dot infrared photodetector; postgrowth capping; quantum confinement; quantum dot-in-a-well; temperature 77 K to 250 K; voltage 7 V; Dark current; Detectors; Materials; Photodetectors; Physics; Quantum dots; Temperature measurement; Engineered quantum dots (EQDs); infrared detectors; photodetectors quantum dots (QDs);
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2010.2096231
Filename
5648464
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