Title :
Guest Editors´ Introduction: Managing Uncertainty through Postfabrication Calibration and Repair
Author :
Bhunia, Swarup ; Rao, Rahul
Author_Institution :
Case Western Reserve University
Abstract :
This special issue presents six articles that highlight challenges, and approaches toward improving, design yield and reliability through postsilicon optimizations. The articles cover postsilicon adaptation and repair issues in a wide range of areas including analog circuits, embedded memories, and multicore systems.
Keywords :
Built-in self-test; Calibration; Special issues and sections; Uncertainty; built-in self-repair; calibration; design and test; many-core; multicore; postsilicon optimization; reliability; self-repair; thermal management; yield improvement;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.134
