An electronic machine for statistical particle analysis

A system is described for associating and collecting the intercepts of individual particles in a particle scanning system, where the information is presented as a function of the scanning voltages. A series of stores is used to segregate the intercepts, each store having its own memory system and provision for re-use on completion of the scanning of the particle with which it is associated; the stores can thus be used many times during a single frame scan. A method of adding the intercepts of each particle to obtain a measure of the area of the particle is described, but this must be regarded as only one of the possibilities of extracting information from the series of intercepts collected.