Title :
REBULF super junction MOSFET with N+ buried layer
Author :
Baoxing Duan ; Yintang Yang
Author_Institution :
Key Lab. of the Minist. of Educ. for Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´an, China
Abstract :
A reduced bulk field (REBULF) super junction metal-oxide semiconductor field-effect transistor is designed for the first time with N+ buried layer in the P-type high resistance substrate. The substrate-assisted depletion effect, resulting from charge imbalance between the N and P-type pillars when the super junction is implemented on the P-type substrate, is suppressed due to the charge compensation by the N+ buried layer. The high electric field around the drain is reduced, thanks to the REBULF effect which causes the redistribution of the electric field in the drift region; thus the breakdown voltage is improved because the substrate supports more biases. The new structure features high breakdown voltage, low specific on-resistance and charge balance in drift region.
Keywords :
MOSFET; charge compensation; electric breakdown; REBULF super junction MOSFET; breakdown voltage; buried layer; charge balance; charge compensation; charge imbalance; drift region; n-type pillar; p-type high resistance substrate; p-type pillar; reduced-bulk field super junction metal-oxide semiconductor field-effect transistor; substrate-assisted depletion effect;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl.2011.0426