Title :
SPICE-compatible physical model of nanocrystal floating gate devices for circuit simulation
Author :
Schinke, D. ; Priyadarshi, Shekhar ; Shepherd Pitts, W. ; Di Spigna, Neil ; Franzon, P.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fDate :
11/1/2011 12:00:00 AM
Abstract :
The majority of nanocrystal floating gate research has been done at the device level. Circuit-level research is still in its early stages because of the lack of a physical device model appropriate for circuit simulations. In this study, a comprehensive and accurate SPICE-compatible physical equation-based model of nanocrystal floating gate devices is developed based on uniform direct tunnelling and Fowler-Nordheim tunnelling. The main contribution is a Verilog-A module that captures the physical behaviours of programming and erasing the device. A predictive NMOS model is then used for modelling the conduction channel to determine the behavioural I-V characteristics. The proposed model uses only explicit formulae resulting in fast computation appropriate for circuit simulation and can be used in any SPICE simulator supporting Verilog-A. It interacts dynamically with the rest of the circuit and includes charge leakage which enables power consumption analysis. The simulation results of the proposed model fit well to experimental results of various fabricated devices. Additionally, it is verified in HSPICE, demonstrating a significant speedup and good agreement with a numerical device simulator. This study is important in bridging the gap between device- and circuit-level research.
Keywords :
MOS integrated circuits; MOSFET; SPICE; circuit simulation; hardware description languages; nanoelectronics; nanostructured materials; numerical analysis; tunnelling; Fowler-Nordheim tunnelling; NMOS model; SPICE simulator; SPICE-compatible physical equation-based model; Verilog-A module; charge leakage; circuit simulation; conduction channel; nanocrystal floating gate devices; numerical device simulator; power consumption analysis; predictive NMOS transistor; uniform direct tunnelling;
Journal_Title :
Circuits, Devices & Systems, IET
DOI :
10.1049/iet-cds.2010.0410