Title :
Planar topological routing
Author :
Lim, Andrew ; Thanvantri, Venkat ; Sahni, Sartaj
Author_Institution :
Inf. Technol. Inst., Nat. Comput. Board, Singapore
fDate :
6/1/1997 12:00:00 AM
Abstract :
We develop a simple linear time algorithm to determine if a collection of two-pin nets can be routed, topologically, in a plane (i.e., single layer). Experiments indicate that this algorithm is faster than the linear time algorithm of Marek-Sadowska and Tarng. Topological routability testing of a collection of multipin nets is shown to be equivalent to planarity testing, and a simple linear time algorithm is developed for the case when the collection of modules remains connected following the deletion of all nets with more than two pins
Keywords :
algorithm theory; circuit layout CAD; integrated circuit layout; network routing; network topology; linear time algorithm; multipin nets; planar topological routing; planarity testing; topological routability testing; two-pin nets; Information technology; Integrated circuit interconnections; Pins; Rivers; Routing; Shape; Switches; Testing; Two dimensional displays; Wire;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on