DocumentCode :
1395726
Title :
Scale dependent wavelet selection for de-noising of partial discharge detection
Author :
Li, Jian ; Jiang, Tianyan ; Grzybowski, Stanislaw ; Cheng, Changkui
Author_Institution :
Dept. of High Voltage & Insulation Eng., Chongqing Univ., Chongqing, China
Volume :
17
Issue :
6
fYear :
2010
Firstpage :
1705
Lastpage :
1714
Abstract :
Wavelet shrinkage methods are effective for de-noising of partial discharge (PD) detection. Base wavelets are related to distortion of PD signals de-noised by wavelet shrinkage methods. This paper presents a scale dependent wavelet selection scheme for de-noising of PD detection. The scale dependent wavelet selection scheme is called the energy based wavelet selection (EBWS) because an energy criterion is proposed for the scheme. In the proposed energy criterion, a base wavelet is selected as an optimal base wavelet if it can generate an approximation with the largest energy among all base wavelets for selection at each scale. PD high-frequency signals are simulated and PD ultra-high-frequency signals are obtained by experiments in laboratory for de-noising experiments and analysis. In comparison with the correlation-based wavelet selection (CBWS) scheme, the wavelet shrinkage, based on the EBWS, generates significantly smaller waveform distortion and magnitude errors of de-noised PD signals.
Keywords :
partial discharges; signal denoising; wavelet transforms; correlation-based wavelet selection; denoising; energy based wavelet selection; energy criterion; optimal base wavelet; partial discharge detection; partial discharge ultra-high-frequency signal; scale dependent wavelet selection scheme; waveform distortion; wavelet shrinkage method; Approximation methods; Distortion; Mathematical model; Noise reduction; Partial discharges; White noise; Partial discharge, wavelet shrinkage, de-noising, scale dependent wavelet selection, waveform distortion, magnitude error;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2010.5658220
Filename :
5658220
Link To Document :
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