• DocumentCode
    1398413
  • Title

    Virtualized ECC: Flexible Reliability in Main Memory

  • Author

    Yoon, Doe Hyun ; Erez, Mattan

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Texas at Austin, Austin, TX, USA
  • Volume
    31
  • Issue
    1
  • fYear
    2011
  • Firstpage
    11
  • Lastpage
    19
  • Abstract
    Virtualized error checking and correcting (ECC) is a scheme that virtualizes memory-error correction. Unlike traditional uniform ECC, which provides a fixed level of error tolerance, virtualized ECC enables flexible memory protection by mapping redundant information needed for correcting errors onto the memory namespace. Additionally, virtualized ECC enables error-correction mechanisms that can adapt to user and system demands.
  • Keywords
    DRAM chips; error correction; error detection; fault tolerant computing; redundancy; virtualisation; DRAM chip; error checking and correction; memory error correction; redundant memory mapping; virtualized ECC; ECC; Error correction; error checking and correcting; fault tolerance; memory systems; reliability;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2010.103
  • Filename
    5661755