Title :
Prediction of RFI demodulation in BiFET, BiMOS and CMOS operational amplifiers
Author :
Abuelma´atti, Muhammad Taher
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Bahrain Univ.
fDate :
2/1/1991 12:00:00 AM
Abstract :
A model is proposed for the differential-input-voltage/output-current characteristic of JFET and MOSFET differential amplifiers. Using this model a closed-form expression is derived for the output signal of BiFET, BiMOS and CMOS operational amplifiers excited by a multisinusoidal input signal. Using this expression, the RFI demodulation in these operational amplifiers can be predicted
Keywords :
BIMOS integrated circuits; CMOS integrated circuits; demodulation; linear integrated circuits; monolithic integrated circuits; operational amplifiers; radiofrequency interference; BiFET operational amplifiers; BiMOS operational amplifiers; CMOS operational amplifiers; JFET differential amplifiers; MOSFET differential amplifiers; RFI demodulation; model; multisinusoidal input signal; output signal; radiofrequency interference;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G
