Title :
Applying the Model-View-Controller Paradigm to Adaptive Test
Author :
Kupp, Nathan ; Makris, Yiorgos
Abstract :
The paper states that adaptive testing has been a focus area for IC testing in the last few years. The “Model-View-Controller”(MVC) architecture has the potential to improve engineering productivity for analysis and application of Adaptive Testing.
Keywords :
electronic engineering computing; integrated circuit testing; software architecture; IC testing; MVC architecture; adaptive testing; engineering productivity; integrated circuit testing; model-view-controller paradigm; Adaptation models; Adaptive systems; Analytical models; Data models; Semiconductor device modeling; Testing; Adaptive test; MVC; analog and RF test; yield learning;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.2179370
