White light dispersion measurements by one- and two-dimensional spectral interference

Author

Meshulach, D. ; Yelin, D. ; Silberberg, Y.

Author_Institution

Dept. of Phys. of Complex Syst., Weizmann Inst. of Sci., Rehovot, Israel

Volume

33

Issue

11

fYear

1997

fDate

11/1/1997 12:00:00 AM

Firstpage

1969

Lastpage

1974

Abstract

White light dispersion measurements by and two-dimensional spectral interference are shown. One-dimensional white light spectral interference measurements allow accurate characterization of dispersion using weak optical fields. Two-dimensional spectral interference allows for real-time measurements since no post-processing is needed, and therefore can be used in situations where the optical properties of the elements under test vary in time. We demonstrate the applicability of the two methods for characterizing dispersive elements such as optical glasses and dielectric coatings

Keywords

light interference; light interferometry; optical dispersion; optical elements; optical films; optical glass; optical testing; 1D white light spectral interference measurements; accurate characterization; dielectric coatings; one-dimensional spectral interference; optical dispersive elements testing; optical glasses; post-processing; real-time measurements; two-dimensional spectral interference; weak optical fields; white light dispersion measurements; Dielectric measurements; Interference; Optical devices; Optical fiber dispersion; Optical filters; Optical interferometry; Optical pulse compression; Optical pulses; Pulse measurements; Ultrafast optics;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.641311

Filename

641311