Title :
Group theoretic signature analysis
Author_Institution :
Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
fDate :
11/1/1990 12:00:00 AM
Abstract :
A new class of data-compression techniques called group-theoretic signature analysis (GTSA) for testing a logic network is proposed, and the fault coverage of the method is analyzed. This method is a generalization of accumulator compression testing. Built-in-self-test for processor environments is feasible with GTSA
Keywords :
built-in self test; data compression; logic circuits; logic testing; accumulator compression testing; built-in self-test; data-compression techniques; fault coverage; group-theoretic signature analysis; logic network; processor environments; testing; Bipartite graph; Built-in self-test; Circuit faults; Circuit testing; Data compression; Logic testing; Routing; Switches; Very large scale integration; Wires;
Journal_Title :
Computers, IEEE Transactions on
