• DocumentCode
    1402253
  • Title

    Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education

  • Author

    Hu, John ; Haffner, Mark ; Yoder, Samantha ; Scott, Mark ; Reehal, Gursharan ; Ismail, Mohammed

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    53
  • Issue
    4
  • fYear
    2010
  • Firstpage
    662
  • Lastpage
    671
  • Abstract
    The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test education at the collegiate level is cited as one of the main sources for this problem. In response to this situation, the Department of Electrical and Computer Engineering at the Ohio State University, Columbus, has partnered with Texas Instruments to establish an IC test-engineering-oriented course. The course objectives are to familiarize students with industrial testing techniques and to help students obtain the fundamental skill sets required to be competent mixed-signal IC test engineers. A novel laboratory pedagogy is developed to achieve these objectives. The results of the classroom assignments and the feedback provided by students, faculty, and industry representatives indicate that the approach has successfully achieved these goals.
  • Keywords
    electronic engineering education; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; industrial testing techniques; industry-oriented laboratory development; mixed-signal IC test education; Circuit testing; Computer science education; Electronic equipment testing; Electronics industry; Feedback; Industrial electronics; Instruments; Integrated circuit testing; Laboratories; Semiconductor device testing; Industry-oriented; integrated circuits (ICs); laboratory development; mixed-signal IC test; test engineering;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.2010.2040738
  • Filename
    5405080