A high-Q bandpass fully differential SC filter with enhanced testability

Author

Vázquez, Diego ; Rueda, Adoración ; Huertas, José Luis ; Peralías, Eduardo

Author_Institution

Seville Univ., Spain

Volume

33

Issue

7

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

976

Lastpage

986

Abstract

This paper presents a low-cost testing approach for switched-capacitor filters. A design for testability (DfT) methodology is discussed, and a system-level architecture is proposed providing capabilities for an off- and on-line test as well as a built-in self-test (BIST). To prove the feasibility of this approach, it has been applied to a sixth-order high-Q bandpass switched-capacitor (SC) filter. The benefit is a significant testability enhancement without degrading filter behavior. Experimental results from a silicon prototype are also presented

Keywords

Q-factor; band-pass filters; built-in self test; design for testability; integrated circuit testing; switched capacitor filters; built-in self-test; design for testability; high-Q bandpass fully differential SC filter; off-line test; on-line test; silicon prototype; switched capacitor filter; system-level architecture; Analog circuits; Band pass filters; Built-in self-test; Circuit testing; Degradation; Design for testability; Integrated circuit testing; Prototypes; Silicon; System testing;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.701236

Filename

701236