Title :
A high-Q bandpass fully differential SC filter with enhanced testability
Author :
Vázquez, Diego ; Rueda, Adoración ; Huertas, José Luis ; Peralías, Eduardo
Author_Institution :
Seville Univ., Spain
fDate :
7/1/1998 12:00:00 AM
Abstract :
This paper presents a low-cost testing approach for switched-capacitor filters. A design for testability (DfT) methodology is discussed, and a system-level architecture is proposed providing capabilities for an off- and on-line test as well as a built-in self-test (BIST). To prove the feasibility of this approach, it has been applied to a sixth-order high-Q bandpass switched-capacitor (SC) filter. The benefit is a significant testability enhancement without degrading filter behavior. Experimental results from a silicon prototype are also presented
Keywords :
Q-factor; band-pass filters; built-in self test; design for testability; integrated circuit testing; switched capacitor filters; built-in self-test; design for testability; high-Q bandpass fully differential SC filter; off-line test; on-line test; silicon prototype; switched capacitor filter; system-level architecture; Analog circuits; Band pass filters; Built-in self-test; Circuit testing; Degradation; Design for testability; Integrated circuit testing; Prototypes; Silicon; System testing;
Journal_Title :
Solid-State Circuits, IEEE Journal of
