DocumentCode
1405520
Title
One-port S-parameter measurements using quasi-optical multistate reflectometer
Author
Thompson, D. ; Pollard, R.D. ; Miles, R.E.
Author_Institution
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
Volume
34
Issue
12
fYear
1998
fDate
6/11/1998 12:00:00 AM
Firstpage
1222
Lastpage
1224
Abstract
A novel multistate reflectometer built using entirely quasi-optical components and capable of operation in the terahertz frequency region has been designed and tested. The system has been calibrated at 100 GHz and measurements of the complex reflection coefficient of passive devices have been made. Excellent agreement, well within the experimental uncertainty, is achieved between the results from a vector network analyser and the quasi-optical multistate
Keywords
S-parameters; microwave reflectometry; millimetre wave measurement; reflectometers; submillimetre wave measurement; waveguide components; 75 GHz to 1.6 THz; THF operation; complex reflection coefficient; one-port S-parameter measurements; passive waveguide devices; quasi-optical multistate reflectometer; terahertz frequency region;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980879
Filename
702386
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