DocumentCode
1406512
Title
Evaluation and characterization of reliable non-hermetic conformal coatings for microelectromechanical system (MEMS) device encapsulation
Author
Wu, Jiali ; Pike, Randy T. ; Wong, C.P. ; Kim, Namsoo P. ; Tanielian, Minas H.
Author_Institution
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
23
Issue
4
fYear
2000
fDate
11/1/2000 12:00:00 AM
Firstpage
721
Lastpage
728
Abstract
The thrust of this project was to evaluate commercial conformal encapsulation candidates for low cost aerospace applications. The candidate conformal coatings evaluated in this study included silicone elastomers, epoxies, and Parylenes with bi-layer or tri-layer designs. Properties characterized in this study included mobile ion permeation and moisture ingress resistance, interfacial adhesion variation through thermal shock cycling and 85°C/85% RH aging. Surface Insulation Resistance (SIR), Triple Track Resistance (TTR) and die shear strength were used for the corresponding electrical and physical property characterizations. Parylene F displayed excellent properties for environmental protection. Silicone elastomers displayed less resistance to the harsh environment as compared to the Parylene family (N, C, D types), but it could provide advantages for low residual stress applications. The change in adhesion strength between Parylene C and silicone elastomers after exposure to thermal shock cycling or 85°C/85%RH aging for different time periods were conducted from die shear test in terms of the interfacial failure. SIR values of all the candidate materials after 1000 h exposure to 85°C/85%RH, with 100 V dc for resistance measurement, range from 1×108-1×109 Ω. Leakage current values after 1000 h exposure to 85°C/85%RH, 175 V bias, are in the range of 10-9 to 10-11 Amp. The bi- or tri-layer conformal coating combination investigated in this study showed significant promise for encapsulation of the microelectromechanical system (MEMS) devices.
Keywords
adhesion; ageing; conformal coatings; elastomers; encapsulation; internal stresses; leakage currents; micromechanical devices; polymer films; shear strength; thermal shock; 100 V; 1000 h; 1E-11 to 1E-9 A; 85 degC; Parylenes; adhesion strength; aging; bi-layer designs; device encapsulation; die shear strength; die shear test; environmental protection; epoxies; interfacial adhesion variation; interfacial failure; leakage current values; low cost aerospace applications; microelectromechanical system device; mobile ion permeation; moisture ingress resistance; nonhermetic conformal coatings; residual stress; silicone elastomers; surface insulation resistance; thermal shock cycling; tri-layer designs; triple track resistance; Adhesives; Aging; Coatings; Electric resistance; Electric shock; Encapsulation; Microelectromechanical systems; Micromechanical devices; Surface resistance; Thermal resistance;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/6040.883764
Filename
883764
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