• DocumentCode
    1406512
  • Title

    Evaluation and characterization of reliable non-hermetic conformal coatings for microelectromechanical system (MEMS) device encapsulation

  • Author

    Wu, Jiali ; Pike, Randy T. ; Wong, C.P. ; Kim, Namsoo P. ; Tanielian, Minas H.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    23
  • Issue
    4
  • fYear
    2000
  • fDate
    11/1/2000 12:00:00 AM
  • Firstpage
    721
  • Lastpage
    728
  • Abstract
    The thrust of this project was to evaluate commercial conformal encapsulation candidates for low cost aerospace applications. The candidate conformal coatings evaluated in this study included silicone elastomers, epoxies, and Parylenes with bi-layer or tri-layer designs. Properties characterized in this study included mobile ion permeation and moisture ingress resistance, interfacial adhesion variation through thermal shock cycling and 85°C/85% RH aging. Surface Insulation Resistance (SIR), Triple Track Resistance (TTR) and die shear strength were used for the corresponding electrical and physical property characterizations. Parylene F displayed excellent properties for environmental protection. Silicone elastomers displayed less resistance to the harsh environment as compared to the Parylene family (N, C, D types), but it could provide advantages for low residual stress applications. The change in adhesion strength between Parylene C and silicone elastomers after exposure to thermal shock cycling or 85°C/85%RH aging for different time periods were conducted from die shear test in terms of the interfacial failure. SIR values of all the candidate materials after 1000 h exposure to 85°C/85%RH, with 100 V dc for resistance measurement, range from 1×108-1×109 Ω. Leakage current values after 1000 h exposure to 85°C/85%RH, 175 V bias, are in the range of 10-9 to 10-11 Amp. The bi- or tri-layer conformal coating combination investigated in this study showed significant promise for encapsulation of the microelectromechanical system (MEMS) devices.
  • Keywords
    adhesion; ageing; conformal coatings; elastomers; encapsulation; internal stresses; leakage currents; micromechanical devices; polymer films; shear strength; thermal shock; 100 V; 1000 h; 1E-11 to 1E-9 A; 85 degC; Parylenes; adhesion strength; aging; bi-layer designs; device encapsulation; die shear strength; die shear test; environmental protection; epoxies; interfacial adhesion variation; interfacial failure; leakage current values; low cost aerospace applications; microelectromechanical system device; mobile ion permeation; moisture ingress resistance; nonhermetic conformal coatings; residual stress; silicone elastomers; surface insulation resistance; thermal shock cycling; tri-layer designs; triple track resistance; Adhesives; Aging; Coatings; Electric resistance; Electric shock; Encapsulation; Microelectromechanical systems; Micromechanical devices; Surface resistance; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.883764
  • Filename
    883764