Title :
Accelerated outage probability testing for PMD induced impairment
Author_Institution :
Lucent Technol. Bell Labs., Holmdel, NJ, USA
Abstract :
We have proposed a method of accelerated outage probability testing (AOPT) for polarization-mode-dispersion (PMD) induced penalty, analogous to the accelerated aging testing (AAT) for the device reliability. We find that the square of the mean PMD in AOPT is equivalent to the temperature in AAT. By increasing the mean PMD of the system tested, the outage probability is exponentially accelerated. Using this approach, for the first time, long-term performance on the order of years can be deduced by conducting a short-term (days) test.
Keywords :
life testing; optical fibre communication; optical fibre dispersion; optical fibre polarisation; optical fibre testing; probability; telecommunication network reliability; PMD induced impairment; accelerated aging testing; accelerated outage probability testing; device reliability; exponentially accelerated tests; long-term performance; optical fibre communication; optical fibre testing; polarization-mode-dispersion induced penalty; short-term test; Accelerated aging; Acceleration; Higher order statistics; Life estimation; Optical fiber communication; Optical fiber polarization; Polarization mode dispersion; Probability; System testing; Temperature;
Journal_Title :
Photonics Technology Letters, IEEE
