DocumentCode :
1406879
Title :
Constant energy device test for electrostatic discharge (ESD) of semiconductor devices
Author :
Greason, William D. ; Bulach, Sviatoslav
Author_Institution :
Dept. of Electr. Eng., Univ. of Western Ontario, London, Ont., Canada
Volume :
33
Issue :
1
fYear :
1997
Firstpage :
286
Lastpage :
297
Abstract :
An analysis is presented fur the models and test methods used to simulate the electrostatic discharge (ESD) event for a charged semiconductor device. A new constant energy device (CED) test method is proposed to provide control of charge and potential for constant energy discharges and give a better evaluation of device reliability. Experimental results are presented for tests conducted on a basic CMOS structure
Keywords :
MIS devices; electrostatic discharge; semiconductor device models; semiconductor device reliability; semiconductor device testing; CMOS semiconductor devices; ESD event; constant energy device test; constant energy discharges; device reliability; electrostatic discharge; Circuit testing; Electrostatic discharge; Equations; Integrated circuit modeling; Integrated circuit packaging; Pins; Semiconductor device testing; Semiconductor devices; Switches; Switching circuits;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.567133
Filename :
567133
Link To Document :
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