• DocumentCode
    1407424
  • Title

    Effect of emitter layer concentration on the performance of GaAs p +-i homojunction far-infrared detectors: a comparison of theory and experiment

  • Author

    Shen, Wenzhong ; Perera, A. G Unil ; Francombe, M.H. ; Liu, H.C. ; Buchanan, M. ; Schaff, William J.

  • Author_Institution
    Dept. of Phys. & Astron., Georgia State Univ., Atlanta, GA, USA
  • Volume
    45
  • Issue
    8
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    1671
  • Lastpage
    1677
  • Abstract
    The performance of GaAs multilayer (p+-i-p+-i-...) homojunction interfacial workfunction internal photoemission (HIWIP) far-infrared (FIR) detectors as a function of emitter layer (p+) concentration is reported. The dark current characteristics have been investigated and compared with a model which includes the space charge, tunneling, and multiple-image-force effects. The experimentally determined detector cutoff wavelength is found to be in reasonable agreement with the high density (HD) theory. The detector responsivity follows well the quantum efficiency predicted by scaling the free carrier absorption coefficient linearly with the doping concentration. All these comparisons are necessary to design and optimize GaAs HIWIP FIR detectors
  • Keywords
    III-V semiconductors; doping profiles; gallium arsenide; infrared detectors; space-charge-limited conduction; tunnelling; GaAs; dark current characteristics; detector cutoff wavelength; doping concentration; emitter layer concentration; far-infrared detectors; free carrier absorption coefficient; high density theory; homojunction interfacial workfunction internal photoemission; multiple-image-force effects; p+-i homojunction; quantum efficiency; space charge; tunneling; Dark current; Detectors; Finite impulse response filter; Gallium arsenide; High definition video; Nonhomogeneous media; Photoelectricity; Semiconductor process modeling; Space charge; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.704362
  • Filename
    704362