• DocumentCode
    1407487
  • Title

    Simultaneous Handling of Symmetry, Common Centroid, and General Placement Constraints

  • Author

    Ma, Qiang ; Xiao, Linfu ; Tam, Yiu-Cheong ; Young, Evangeline F Y

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • Volume
    30
  • Issue
    1
  • fYear
    2011
  • Firstpage
    85
  • Lastpage
    95
  • Abstract
    In today´s system-on-chip designs, both digital and analog parts of a circuit will be implemented on the same chip. Parasitic mismatch induced by layout will affect circuit performance significantly for analog designs. Consideration of symmetry and common centroid constraints during placement can help to reduce these errors. Besides these two specific types of placement constraints, other constraints, such as alignment, abutment, preplace, and maximum separation, are also essential in circuit placement. In this paper, we will present a placement methodology that can handle all these constraints at the same time. To the best of our knowledge, this is the first piece of work that can handle symmetry constraint, common centroid constraint, and other general placement constraints, simultaneously. Experimental results do confirm the effectiveness and scalability of our approach in solving this mixed constraint-driven placement problem.
  • Keywords
    analogue integrated circuits; constraint handling; integrated circuit layout; system-on-chip; C-CBL; abutment constraint; alignment constraint; analog circuit designs; analog placement framework; center-based corner block list; circuit layout; circuit placement methodology; common centroid constraints; general placement constraints; maximum separation constraint; mixed constraint-driven placement problem; parasitic mismatch; preplace constraint; symmetry constraint handling; system-on-chip design; Annealing; Cost function; Engines; Layout; Shape; Simulated annealing; Upper bound; Analog placement; common centroid constraints; constraint graph; corner block list; sequence pair (SP); symmetry constraints;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2010.2064490
  • Filename
    5671537