Title :
Analysis of E-H plane tee junction using a variational formulation
Author :
Das, B.N. ; Sarma, N. V S Narasimha
Author_Institution :
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
fDate :
10/1/1991 12:00:00 AM
Abstract :
A three-port equivalent network for an E-H plane tee junction is determined taking into account the effect of waveguide wall thickness and considering the contribution of the dominant mode to the imaginary part of the self-reaction. The parameters of the three-port equivalent network are determined. From a knowledge of the equivalent network parameters, the net impedance loading, reflection coefficient, and coupling are evaluated for an E-H plane tee junction. A comparison between theoretical and experimental results is also presented
Keywords :
equivalent circuits; variational techniques; waveguide couplers; E-H plane tee junction; coupling; dominant mode; net impedance loading; network parameters; reflection coefficient; three-port equivalent network; variational formulation; waveguide wall thickness; Admittance; Coplanar transmission lines; Couplings; Energy storage; Impedance; Planar waveguides; Reflection; Transmission line theory; Waveguide components; Waveguide junctions;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
