Title :
Refractive-index profiling of graded-index planar waveguides from effective indexes measured with different external refractive indexes
Author :
Chiang, Kin Seng ; Wong, Chi Lai ; Cheng, Sin Yip ; Chan, Hau Ping
Author_Institution :
Optoelectron. Res. Centre, City Univ. of Hong Kong, Hong Kong
Abstract :
We extend the well-known inverse Wentzel-Kramer-Brillouin (WKB) method for refractive-index profiling of graded-index planar waveguides. We demonstrate, with numerical examples and experimental results, that the refractive-index profile of a graded-index planar waveguide can be calculated from effective indexes measured with different external refractive indexes. With this technique, single-mode and two-mode waveguides can be profiled easily to a good accuracy.
Keywords :
gradient index optics; measurement errors; optical planar waveguides; optical waveguide theory; refractive index measurement; GRIN planar waveguides; WKB method; Wentzel-Kramer-Brillouin method; effective indexes; external refractive indexes; good accuracy; graded-index planar waveguides; refractive-index profile; refractive-index profiling; single-mode waveguides; two-mode waveguides; Optical device fabrication; Optical planar waveguides; Optical refraction; Optical variables control; Optical waveguides; Planar waveguides; Refractive index; Silicon compounds; Tellurium; Wavelength measurement;
Journal_Title :
Lightwave Technology, Journal of
