Title :
Sensitisable-path-oriented clustered voltage scaling technique for low power
Author :
Jou, J.-Y. ; Chou, D.-S.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
7/1/1998 12:00:00 AM
Abstract :
Because the average power consumption of CMOS digital circuits is proportional to the square of the supplied voltage, a clustered voltage scaling (CVS) technique has previously been proposed to reduce power without sacrificing the circuit performance. In this paper the authors propose a path-oriented CVS algorithm, which can take the false paths into account. Extensive experiments are conducted on ISCASX5 benchmark circuits. These experiments show that many more gates can be voltage scaled down in comparison with the original CVS technique. An additional 22%, power reduction ratio over that of the original CVS technique is achieved
Keywords :
CMOS digital integrated circuits; integrated circuit testing; logic testing; CMOS digital circuits; ISCASX5 benchmark circuits; average power consumption; circuit performance; sensitisable-path-oriented clustered voltage scaling technique;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings -
DOI :
10.1049/ip-cdt:19982018