• DocumentCode
    141208
  • Title

    Gradient-based magnetic resonance electrical properties imaging of brain tissues

  • Author

    Jiaen Liu ; Xiaotong Zhang ; Schmitter, Sebastian ; Van de Moortele, Pierre-Francois ; Bin He

  • Author_Institution
    Dept. of Biomed. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    6056
  • Lastpage
    6059
  • Abstract
    Electrical properties tomography (EPT) holds promise for noninvasively mapping at high spatial resolution the electrical conductivity and permittivity of biological tissues in vivo using a magnetic resonance imaging (MRI) scanner. In the present study, we have developed a novel gradient-based EPT approach with greatly improved tissue boundary reconstruction and largely elevated robustness against measurement noise compared to existing techniques. Using a 7 Tesla MRI system, we report, for the first time, high-quality in vivo human brain electrical property images with refined structural details, which can potentially merit clinical diagnosis (such as cancer detection) and high-field MRI applications (quantification of local specific absorption rate) in the future.
  • Keywords
    bioelectric phenomena; biomedical MRI; brain; edge detection; electrical conductivity; image reconstruction; permittivity; tomography; MRI scanner; brain tissue electrical properties; electrical property tomography; gradient based EPT approach; gradient based magnetic resonance imaging; high quality human brain electrical property images; in vivo biological tissue electrical conductivity; in vivo biological tissue permittivity; in vivo human brain electrical property images; magnetic flux density 7 T; noninvasive mapping; tissue boundary reconstruction; Coils; Image reconstruction; In vivo; Magnetic resonance imaging; Radio frequency; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6945010
  • Filename
    6945010