Title :
Electrostatic image method for the anisotropic half space
Author :
Lindell, I.V. ; Nikoskinen, K.I. ; Viljanen, A.
Author_Institution :
Electromagn. Lab., Helsinki Univ. of Technol., Espoo, Finland
fDate :
7/1/1997 12:00:00 AM
Abstract :
Electrostatic image theory, well known for a point charge in front of an isotropic dielectric half space, is generalised to the case where the half space may be anisotropic, characterised by a symmetric and positive-definite permittivity dyadic. The theory is derived through Heaviside operational calculus involving manipulations with pseudodifferential operators. As a result, the image of a point charge is seen to consist of a point charge at the mirror image point plus a continuous distribution of surface charge filling an angular sector the apex of which lies at the image point. The surface charge is shown to obey a simple analytic law. The angle of the image sector depends on the amount of transverse anisotropy of the half space. For decreasing anisotropy, the angle becomes small and the angular image can be approximated by a quadrifilar line charge coinciding with the result recently obtained by these authors for the case of small anisotropy. Numerical tests confirm the validity of the image expression. The result can be readily applied to a wide variety of electrostatic problems involving sources and obstacles in front of an anisotropic half space, making a numerical development of a Green function for the anisotropic half space obsolete
Keywords :
Fourier transforms; boundary-value problems; electric charge; electrostatics; mathematical operators; permittivity; Fourier transforms; Heaviside operational calculus; angular sector; anisotropic half space; continuous distribution; electrostatic image method; isotropic dielectric half space; mirror image point; operational expansions; point charge; positive-definite permittivity dyadic; pseudodifferential operators; surface charge; symmetric dyadic; transmission line equations;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
DOI :
10.1049/ip-smt:19971317