Title :
Microwave intercept receiver sensitivity estimation
Author_Institution :
Racal Radar Defence Syst. Ltd., Crawley, UK
fDate :
8/1/1997 12:00:00 AM
Abstract :
The author applies probability and correlation analysis methods to predict the RF sensitivity and measurement accuracy of wideband automatic electronic warfare (EW) systems. The effects of system noise on the accuracy and fidelity of the main EW parameter estimators, pulse width, frequency and bearing in the critical threshold region are investigated. The sensitivity analysis technique is suitable for use in modern software spreadsheets to generate accurate and realistic system budgets and covers receiver systems driven by RF channels exhibiting large scale gain variations. The method divides the RF band into a number of subbands and derives equations for the analysis of multiplier-based demodulators used in instantaneous frequency measurement (IFM) and interferometer systems. Common receiver demodulators are compared in terms of signal-to-noise performance and include the square law detector, the coherent detector, delay line discriminators and the interferometer or homodyne. The article also compares the design and performance of some example receiver types
Keywords :
correlation methods; demodulators; electronic warfare; frequency measurement; noise; probability; radar detection; radar receivers; radiowave interferometers; receivers; sensitivity analysis; EW parameter estimators; RF channels; accuracy; bearing; coherent detector; correlation analysis; delay line discriminators; instantaneous frequency measurement; interferometer; large scale gain variations; measurement accuracy; microwave intercept receiver; multiplier based demodulators; probability; pulse width; receiver systems; sensitivity analysis; sensitivity estimation; signal to noise performance; software spreadsheets; square law detector; subbands; system budgets; system noise; threshold region; wideband automatic electronic warfare systems;
Journal_Title :
Radar, Sonar and Navigation, IEE Proceedings -
DOI :
10.1049/ip-rsn:19971211