Title :
CoCrTa intermediate layers on NiAl underlayers for CoCrPt longitudinal thin film magnetic media
Author :
Zou, Jie ; Laughlin, David E. ; Lambeth, David N.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
7/1/1998 12:00:00 AM
Abstract :
A CoCrTa intermediate layer was added between a CoCrPt recording layer and a NiAl underlayer. CoCrPt (101¯0) texture improves and the in-plane coercivity increases using this medium structure. The effects of substrate bias on film texture and coercivity were studied. Pt concentration and lattice constant for CoCrPt were also characterized as functions of the bias voltage
Keywords :
X-ray diffraction; aluminium alloys; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; lattice constants; magnetic recording; magnetic thin films; nickel alloys; platinum alloys; sputter deposition; sputtered coatings; surface texture; tantalum alloys; CoCrPt; CoCrPt longitudinal thin film magnetic media; CoCrTa; CoCrTa intermediate layers; NiAl; NiAl underlayers; Pt concentration; XRD; bias voltage dependence; film texture; improved texture; in-plane coercivity; in-plane magnetic properties; lattice constant; lattice match; sputtered films; substrate bias effect; Chromium; Coercive force; Epitaxial growth; Lattices; Magnetic films; Magnetic properties; Magnetic recording; Sputtering; Substrates; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
